SN74HCT652DWR 유사

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- SCAN TEST DEVICE WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS
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- OCTAL BUFFERS/DRIVERS WITH 3-STATE OUTPUTS
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- DUAL 5-INPUT POSITIVE-NOR GATES
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- 3.3 V ABT 16-BIT BUS TRANSCEIVERS AND REGISTERS WITH 3-STATE OUTPUTS
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- HEX INVERTERS WITH OPEN COLLECTOR OUTPUTS
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- DUAL POSITIVE-EDGE-TRIGGERED D-TYPE FLIP-FLOPS WITH CLEAR AND PRESET
SN74HC02DBR
- QUADRUPLE 2-INPUT POSITIVE-NOR GATES

SN74HCT652DWR Datasheet 및 사양

제조사 : TI

포장 : DW

팡 : 24

온도 : 분 -40 °C | 맥스 85 °C

파일크기 : 167 KB

응용 프로그램 : OCTAL BUS TRANSCEIVERS AND REGISTERS WITH 3-STATE OUTPUTS