SN74BCT8374ADWR 유사

  • SN74BCT8374ADWR
    • SCAN TEST DEVICE WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS
  • SN74ABT623N
    • OCTAL BUS TRANSCEIVERS WITH 3-STATE OUTPUTS
  • SN74AHC541PWR
    • OCTAL BUFFERS/DRIVERS WITH 3-STATE OUTPUTS
  • SN74S260D
    • DUAL 5-INPUT POSITIVE-NOR GATES
  • SN74LVTH16652DLR
    • 3.3 V ABT 16-BIT BUS TRANSCEIVERS AND REGISTERS WITH 3-STATE OUTPUTS
  • SN7405N3
    • HEX INVERTERS WITH OPEN COLLECTOR OUTPUTS
  • SN74AHC74PWLE
    • DUAL POSITIVE-EDGE-TRIGGERED D-TYPE FLIP-FLOPS WITH CLEAR AND PRESET
  • SN74HC02DBR
    • QUADRUPLE 2-INPUT POSITIVE-NOR GATES

SN74BCT8374ADWR Datasheet 및 사양

제조사 : TI 

포장 : DW 

팡 : 24 

온도 : 분 0 °C | 맥스 70 °C

파일크기 : 323 KB

응용 프로그램 : SCAN TEST DEVICE WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS 

다운로드를 SN74BCT8374ADWR

SN74BCT8374ADWR PDF