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SNJ54BCT8240AFK 사양 : SCAN TEST DEVICES WITH OCTAL BUFFERS
SNJ54BCT8240AFK 유사
- SNJ5400J
- QUADRUPLE 2-INPUT POSITIVE-NAND GATES
- SNJ5400W
- QUADRUPLE 2-INPUT POSITIVE-NAND GATES
- SNJ5400WA
- QUADRUPLE 2-INPUT POSITIVE-NAND GATES
- SNJ5401J
- QUADRUPLE 2-INPUT POSITIVE-NAND GATES WITH OPEN-COLLECTOR OUTPUT
- SNJ5401W
- QUADRUPLE 2-INPUT POSITIVE-NAND GATES WITH OPEN-COLLECTOR OUTPUT
- SNJ5402J
- QUADRUPLE 2-INPUT POSITIVE-NOR GATES
- SNJ5402J
- QUADRUPLE 2-INPUT POSITIVE-NOR GATES
- SNJ5402W
- QUADRUPLE 2-INPUT POSITIVE-NOR GATES
SNJ54BCT8240AFK Datasheet 및 사양
제조사 : TI
포장 : FK
팡 : 28
온도 : 분 -55 °C | 맥스 125 °C
파일크기 : 322 KB
응용 프로그램 : SCAN TEST DEVICES WITH OCTAL BUFFERS
다운로드를 SNJ54BCT8240AFK
